SEM Controls
Universal and fully integrated control system for all Scanning ELectron Microscopes and Microanalysers.
Benefits
Take control over your microscope with new cutting-edge electronics and software, including control of all electron-optics on the column, electron gun power supply, all electron detectors, sample stage and chamberscope.
- Increase reliability, reduce downtime and minimise service costs with highest quality electronics
- Maximise productivity and efficiency of your SEM with integrated and universal software
- Use our new automatic functions: auto-focus, auto-brightness, auto-contrast
- Connect your SEM to any Microsoft Windows PC or laptop with USB interface
- Use standard PC input or add the optional USB SEM control panel
- Enjoy the power and versatility of DISS5 image acquisition software
- Make calibrated measurements with the integrated DIPS image processing software
- Automate complex dependencies between microscope control parameters
- Improve the performance of the SEM with optional electron detectors
- See your chamber in operation with optional IR chamberscope
- Extend the use of the SEM with optional EBIC, EBAC/RCI amplifiers
- See the third dimension in your SEM with the optional live 3D electron topography package
- Enhance your analysis with optional structure measurement software
- Bring nanomanufacture to your SEM with the optional e-beam lithography software package
Every microscope configuration and install is carefully tailored for each customer, as microscope customization and upgrades are at the core of the company ethos.
Pictures/videos