Surface Analysis
SPECS
KRATOS
IMINA TECHNOLOGIES
POINT ELECTRONIC
FERROVAC
Mass Spectrometer
ISOPRIME
Sample Preparation
HERZOG
HERZOG Sparepar List
European partner
EURO PEAK

PRODUCTS FOR YOUR SEM

  • product

    EBIC acquisition
    Enhance your measurements in SEM and FIB-SEM with the most advanced and integrated Electron Beam Induced Current (EBIC) acquisition system. The electronics are designed ground-up for quantitative measurement of induced currents down to the smallest currents. The sophisticated system includes current amplifier, voltage bias and IV sweep tool, noise suppression and lock-in option, alongside complete SEM active scan control and simultaneous signal acquisition..
    Details view
  • product

    EBAC/RCI acquisition
    Find and image shorts, opens and high resistance points of devices in SEM and SEM-FIB with the most advanced and integrated Electron Beam Absorbed Current/Resistive Contrast Imaging system. Image absorbed currents at a fraction of the beam current with low-noise high-gain amplifier, noise suppression and lock-in option. Acquire EBAC/RCI alongside Voltage Contrast images, with the built-in voltage bias, active scan control and simultaneous SE/BSE acquisition..
    Details view
  • product

    SEM acquisition - DISS5
    Expand the performance and functions of your microscope with the most powerful and versatile digital scan generator & image acquisition system. Enjoy modern workflows and ease of use..
    Details view
  • product

    SEM topography
    Bring live 3D topography acquisition, visualisation and measurements to your microscope with dedicated backscattered electron detectors, automated 3D calibration and shape-from-shading reconstruction..
    Details view