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AXIS Ultra DLD

  • product

    AXIS Ultra DLD
    The AXIS Ultra DLD provides market leading photoelectron spectroscopic performance and fast XPS imaging with the capability to accomodate additional surface analytical techniques including ultra violet photoemission (UPS), scanning Auger microscopy (SAM), secondary electron microscopy (SEM), ion scattering spectroscopy (ISS) and secondary ion mass spectrometry (SIMS)..
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